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Browsing by Author Hutchinson, IB

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Issue DateTitleAuthor(s)
2003The impact of low energy proton damage on the operational characteristics of EPIC-MOS CCDsAmbrosi, RM; Smith, DR; Abbey, AF; Hutchinson, IB; Kendziorra, E, et al
2004Low noise charge injection in the CCD22Smith, DR; Holland, AD; Hutchinson, IB; Abbey, AF; Pool, P, et al
2003Proton induced leakage current in CCDsSmith, DR; Holland, AD; Robbins, MS; Ambrosi, RM; Hutchinson, IB
2004Random telegraph signals in charge coupled devicesSmith, DR; Holland, AD; Hutchinson, IB
Showing results 1 to 4 of 4