Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/23837
Title: Residual Convolution LSTM Network for Machines Remaining Useful Life Prediction and Uncertainty Quantification
Authors: Wang, W
Lei, Y
Yan, T
Li, N
Nandi, AK
Keywords: deep learning;residual convolution LSTM network;remaining useful life prediction;uncertainty quantification
Issue Date: 21-Dec-2021
Publisher: Intelligence Science and Technology Press Inc.
Citation: Wang, W. et al. (2022) 'Residual Convolution LSTM Network for Machines Remaining Useful Life Prediction and Uncertainty Quantification', Journal of Dynamics, Monitoring and Diagnostics, 1 (1), pp. 2 - 8. doi: 10.37965/jdmd.v2i2.43.
Abstract: Recently, deep learning is widely used in the field of remaining useful life (RUL) prediction. Among various deep learning technologies, recurrent neural network (RNN) and its variant, e.g., long short-term memory (LSTM) network, are gaining more attention because of their capability of capturing temporal dependence. Although the existing RNN-based approaches have demonstrated their RUL prediction effectiveness, they still suffer from the following two limitations: 1) it is difficult for RNN to extract directly degradation features from original monitoring data, and 2) most of the RNN-based prognostics methods are unable to quantify the uncertainty of prediction results. To address the above limitations, this paper proposes a new method named Residual convolution LSTM (RC-LSTM) network. In RC-LSTM, a new ResNet-based convolution LSTM (Res-ConvLSTM) layer is stacked with convolution LSTM (ConvLSTM) layer to extract degradation representations from monitoring data. Then, predicated on the RUL following a normal distribution, an appropriate output layer is constructed to quantify the uncertainty of the forecast result. Finally, the effectiveness and superiority of RC-LSTM is verified using monitoring data from accelerated degradation tests of rolling element bearings.
URI: https://bura.brunel.ac.uk/handle/2438/23837
DOI: https://doi.org/10.37965/jdmd.v2i2.43
ISSN: 2833-650X
Other Identifiers: ORCiD: Yaguo Lei https://orcid.org/0000-0002-5167-1459
ORCiD: Tao Yan https://orcid.org/0000-0002-3328-2118
ORCiD: Asoke Nandi https://orcid.org/0000-0001-6248-2875.
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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