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http://bura.brunel.ac.uk/handle/2438/24381
Title: | Research on Printing Defects Inspection of Solder Paste Images |
Authors: | Qi, M Yin, T Cheng, G Xu, Y Meng, H Wang, Y Cui, S |
Keywords: | solder paste inspection;image interpolation;solder paste area detection;connected domain labeling |
Issue Date: | 25-Mar-2022 |
Publisher: | Hindawi Limited |
Citation: | Qi, M. et al. (2022) 'Research on Printing Defects Inspection of Solder Paste Images', Wireless Communications and Mobile Computing, 2022, Article ID 8651956, pp. 1 - 9. doi: 10.1155/2022/8651956. |
Abstract: | Solder paste printing is the first part of the surface mount process flow; its postprinting defect inspection is particularly important. In this paper, we focus on studying the printing defects inspection algorithm for solder paste on PCB (Printed Circuit Board) images. The work proposes a number of methods to enhance the defects inspection performance of solder paste printing: a regional multidirectional data fusion image interpolation method, which can achieve fast and high precision image interpolation; a method for detecting solder paste areas with better accuracy, efficiency, and robustness; an improved connected domain labeling method to reduce time complexity; and defects detection and types classification method, which extracts features and centroid of every solder paste region and completes the inspection by comparing with a standard image. The experiments show that the defects inspection algorithm can detect the most common types of defects with low time consumption, high inspection accuracy, and classification accuracy. |
Description: | Data Availability: The datasets used and/or analyzed during the current study are available from the corresponding author on reasonable request. |
URI: | https://bura.brunel.ac.uk/handle/2438/24381 |
DOI: | https://doi.org/10.1155/2022/8651956 |
ISSN: | 1530-8669 |
Other Identifiers: | ORCiD: Min Qi https://orcid.org/0000-0002-3508-7965 ORCiD: Ting Yin https://orcid.org/0000-0002-9883-6206 ORCiD: Gong Cheng https://orcid.org/0000-0002-0058-1154 ORCiD: Yuelei Xu https://orcid.org/0000-0002-9868-7693 ORCiD: Hongying Meng https://orcid.org/0000-0002-8836-1382 ORCiD: Yi Wang https://orcid.org/0000-0002-7743-1779 ORCiD: Shanshan Cui https://orcid.org/0000-0002-5079-510X Article ID 8651956 |
Appears in Collections: | Dept of Electronic and Electrical Engineering Research Papers |
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FullText.pdf | Copyright © 2022 Min Qi et al. This is an open access article distributed under the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. | 3.33 MB | Adobe PDF | View/Open |
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