The effect of protons on E2V technologies L3Vision CCDs

Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/2734

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DC Field	Value	Language
dc.contributor.author	Smith, DR	-
dc.contributor.author	Holland, AD	-
dc.contributor.author	Robbins, MS	-
dc.coverage.spatial	4	en
dc.date.accessioned	2008-10-08T09:47:56Z	-
dc.date.available	2008-10-08T09:47:56Z	-
dc.date.issued	2003	-
dc.identifier.citation	Nuclear Instruments and Methods. A513: 296-99	en
dc.identifier.uri	http://bura.brunel.ac.uk/handle/2438/2734	-
dc.description.abstract	The effect of different 10 MeV equivalent proton fluences on the performance of E2V Technologies (formerly Marconi applied technologies, formerly EEV) L3Vision Charge Coupled Devices (CCDs) was investigated. The first experimental radiation damage results of the L3Vision device are presented, with emphasis given to the analysis of damage to the gain register of the device. Changes in dark current and generation of bright pixels in the CCD image, store, readout register and gain register as a result of proton irradiation are reported and viewed in light of the potential use of the device in space-based applications.	en
dc.format.extent	251124 bytes	-
dc.format.mimetype	application/pdf	-
dc.language.iso	en	-
dc.publisher	Elsevier	en
dc.subject	Charge coupled device	en
dc.subject	Proton	en
dc.subject	Radiation	en
dc.subject	Low light level	en
dc.subject	L3Vision	en
dc.subject	Damage	en
dc.title	The effect of protons on E2V technologies L3Vision CCDs	en
dc.type	Research Paper	en
Appears in Collections:	Electronic and Computer Engineering Dept of Electronic and Electrical Engineering Research Papers

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