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http://bura.brunel.ac.uk/handle/2438/341
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DC Field | Value | Language |
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dc.contributor.author | Guo, Q | - |
dc.contributor.author | Hierons, RM | - |
dc.contributor.author | Harman, M | - |
dc.contributor.author | Derderian, K | - |
dc.coverage.spatial | 13 | en |
dc.date.accessioned | 2006-11-03T15:47:46Z | - |
dc.date.available | 2006-11-03T15:47:46Z | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | Information and Software Technology, 48 (8): 696-707, Jul 2005 | en |
dc.identifier.uri | http://www.elsevier.com/wps/find/journaldescription.cws_home/525444/description#description | en |
dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/341 | - |
dc.description.abstract | In finite state machine (FSM) based testing, the problem of fault masking in the unique input/ output (UIO) sequence may degrade the test performance of the UIO based methods. This paper investigates this problem and proposes the use of a new type of unique input/output circuit (UIOC) sequence for state verification, which may help to overcome the drawbacks that exist in the UIO based techniques. When constructing a UIOC, overlap and internal state observation schema are used to increase the robustness of a test sequence. Test quality is compared by using the forward UIO method (F-method), the backward UIO method (B-method) and the UIOC method (C-method) separately. Robustness of the UIOCs constructed by the algorithm given in this paper is also compared with those constructed by the algorithm given previously. Experimental results suggest that the C-method outperforms the F- and the B-methods and the UIOCs constructed by the Algorithm given in this paper, are more robust than those constructed by other proposed algorithms. | en |
dc.format.extent | 732366 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language.iso | en | - |
dc.publisher | Elsevier | en |
dc.subject | FSMs | en |
dc.subject | Conformance test | en |
dc.subject | F-UIOs | en |
dc.subject | B-UIOs | en |
dc.subject | UIOCs | en |
dc.subject | Fault masking | en |
dc.subject | Test quality | en |
dc.title | Improved test quality using robust unique input/output circuit sequences (UIOCs) | en |
dc.type | Research Paper | en |
Appears in Collections: | Computer Science Dept of Computer Science Research Papers Software Engineering (B-SERC) |
Files in This Item:
File | Description | Size | Format | |
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Improving Test Qualilty 2006.pdf | 715.2 kB | Adobe PDF | View/Open |
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