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Issue Date | Title | Author(s) |
---|---|---|
2005 | Improved test quality using robust unique input/output circuit sequences (UIOCs) | Guo, Q; Hierons, RM; Harman, M; Derderian, K |
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Subject
- 1 F-UIOs
- 1 Fault masking
- 1 FSMs
- 1 Test quality
- 1 UIOCs