2026-09-26T04:09:57Zhttps://bura.brunel.ac.uk/oai/request

oai:bura.brunel.ac.uk:2438/72962014-11-01T13:09:59Zcom_2438_58col_2438_3672

Beynon, JH Hogarth, CA Olumekor, Louis 2013-03-11T10:07:02Z 2013-03-11T10:07:02Z 1977 http://bura.brunel.ac.uk/handle/2438/7296 This thesis was submitted for the degree of Doctor of Philosophy and awarded by Brunel University. Pure Mn and Mn/MgF2 cermet films (50 to 1500A thick) containing between 10 and 100 Wt % Mn have been prepared by single boat evaporation in vacuo =< 10^(-5) torr. All films studied are ohmic, and the resistivity lying between 100 µΩ-cm and 10 mΩ-cm. Within this range, the resistivity decreases non-linearly with increase in film thickness and increase in Mn content. The effect on the film resistivity of other deposition parameters, viz substrate temperature, residual gas pressure, annealing and aging are investigated. The structure of the films was investigated using X-ray diffraction and transmission electron microscopy. Films with negative TCR have low activation energies (~ 1 to 100 meV) in the temperature range 110 to 720K, and the electronic conduction mechanism in these films is probably electron tunnelling and/or percolation depending on film composition, thickness and annealing temperature. Submitted by Lesh Gowreesunker (lesh.gowreesunker@brunel.ac.uk) on 2013-03-11T10:06:31Z No. of bitstreams: 1 FulltextThesis.pdf: 9005583 bytes, checksum: 6f21d7517c7fd9ea3d2ca7e70bbaa830 (MD5) Approved for entry into archive by Lesh Gowreesunker(lesh.gowreesunker@brunel.ac.uk) on 2013-03-11T10:07:02Z (GMT) No. of bitstreams: 1 FulltextThesis.pdf: 9005583 bytes, checksum: 6f21d7517c7fd9ea3d2ca7e70bbaa830 (MD5) Made available in DSpace on 2013-03-11T10:07:02Z (GMT). No. of bitstreams: 1 FulltextThesis.pdf: 9005583 bytes, checksum: 6f21d7517c7fd9ea3d2ca7e70bbaa830 (MD5) This study is funded by the Mid-West State Goverment. en Brunel University School of Engineering and Design PhD Theses http://bura.brunel.ac.uk/bitstream/2438/7296/1/FulltextThesis.pdf The electrical properties of pure manganese and manganese/magnesium fluoride cermet thin film resistors Thesis