Browsing by Author Hierons, RM

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Issue DateTitleAuthor(s)
2016Hardness of deriving invertible sequences from finite state machinesHierons, RM; Mousavi, MR; Thomsen, MK; Türker, UC
2007Heuristics for fault diagnosing when testing from finite state machinesGuo, Q; Hierons, RM; Harman, M; Derderian, K
2008High capacity steganographic method based upon JPEGAl-Mohammad, A; Hierons, RM; Ghinea, G
2017How to manage a conference special issueHierons, RM
22-Mar-2017Implementation relations and probabilistic schedulers in the distributed test architectureHierons, RM; Nunez, M
2012Implementation relations and test generation for systems with distributed interfacesHierons, RM; Merayo, MG; Núñez, M
2013Implementation relations for testing through asynchronous channelsHierons, RM
2005Improved test quality using robust unique input/output circuit sequences (UIOCs)Guo, Q; Hierons, RM; Harman, M; Derderian, K
2006Improving fault coverage and minimising the cost of fault identification when testing from finite state machinesGuo, Qiang
2015Incomplete distinguishing sequences for finite state machinesHierons, RM; Turker, UC
2011An integrated search-based approach for automatic testing from extended finite state machine (EFSM) modelsKalaji, AS; Hierons, RM; Swift, S
2011An integrated search-based approach for automatic testing from extended finite state machine (EFSM) modelsKalaji, AS; Hierons, RM; Swift, S
-Integrating graphical and natural language specifications to support analysis and testingHierons, RM
2017The interlocutory tool box: techniques for curtailing coincidental correctnessPatel, Krishna
2009JPEG steganography: A performance evaluation of quantization tablesAl-Mohammad, A; Ghinea, G; Hierons, RM
2004Loop squashing transformations for amorphous slicingHu, L; Harman, M; Hierons, RM; Binkley, D
2017A Mapping Study on Testing Non-testable SystemsPatel, K; Hierons, RM
2007A meta-analysis approach to refactoring and XPCounsell, S; Hierons, RM; Loizou, G
2015A methodology for validating cloud models using metamorphic testingNunez, A; Hierons, RM
1999Minimizing the cost of fault location when testing from a finite state machineHierons, RM