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Title: Minimizing the cost of fault location when testing from a finite state machine
Authors: Hierons, RM
Keywords: Finite state machine;Fault location;Adaptive testing;Minimal length test
Issue Date: 1999
Publisher: Elsevier Science
Citation: Computer Communications, 22(2): 120-127(8), Jan 1999
Abstract: If a test does not produce the expected output, the incorrect output may have been caused by an earlier state transfer failure. Ghedamsi and coworkers generate a set of candidates and then produce further tests to locate the failures within this set. We consider a special case where there is a state identification process that is known to be correct. A number of preset and adaptive approaches to fault location are described and the problem of minimizing the cost is explored. Some of the approaches lead to NP-hard optimization problems for which possible heuristics are suggested.
Appears in Collections:Computer Science
Dept of Computer Science Research Papers
Software Engineering (B-SERC)

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