Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/11024
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dc.contributor.authorLy, DQ-
dc.contributor.authorMakatsoris, C-
dc.date.accessioned2015-06-16T15:32:28Z-
dc.date.available2012-07-
dc.date.available2015-06-16T15:32:28Z-
dc.date.issued2012-
dc.identifier.citationJournal of Surface Engineered Materials and Advanced Technology, 2(3A): 194-202, (July 2012)en_US
dc.identifier.issn2161-4881-
dc.identifier.urihttp://www.scirp.org/journal/PaperInformation.aspx?PaperID=21429-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/11024-
dc.description.abstractBy means of total energy calculations within the framework of the local density approximation (LDA), the interactions between a silicon Si(001) surface and a scanning probe are investigated. The tip of the probe, comprising 4 Si atoms scans along the dimer lines above an asymmetric p(2 × 1) surface, at a distance where the chemical interaction between tip-surface is dominant and responsible for image resolution. At that distance, the tip causes the dimer to toggle when it scans above the lower atom of a dimer. The toggled dimers create an alternating pattern, where the immediately adja-cent neighbours of a toggled dimer remain unchanged. After the tip has fully scanned across the p(2 × 1) surface, causes the dimers to arrange in a p(2 × 2) reconstruction, reproducing the images obtained in scanning probe experiments. Our modelling methodology includes simulations that reveal the energy input required to overcome the barrier to the onset of dimer toggling. The results show that the energy input to overcome this barrier is lower for the p(2 × 1) surface than that for the p(2 × 2) or c(4 × 2) surfaces.en_US
dc.description.sponsorshipThis work has been supported by the UK Engineering and Physical Sciences Research Council (EPSRC) under contract EP/F009801/1 and Brunel University’s BRIEF award scheme. The authors would like to thank the School of Engineering and Design for purchasing our computing cluster to support research in this area. All simulations were performed on the cluster comprising 64 processors at Brunel University.en_US
dc.language.isoenen_US
dc.publisherScientific Researchen_US
dc.subjectDFTen_US
dc.subjectSi(001)-p(2 × 1), p(2 × 2), c(4 × 2)en_US
dc.subjectScanning probe microscopyen_US
dc.subjectPhase transitionsen_US
dc.subjectDimer togglingen_US
dc.titleA first principles simulation framework for the interactions between a Si(001) surface and a scanning probeen_US
dc.typeArticleen_US
dc.identifier.doihttp://dx.doi.org/10.4236/jsemat.2012.223030-
dc.relation.isPartOfJournal of Surface Engineered Materials and Advanced Technology-
Appears in Collections:Dept of Mechanical and Aerospace Engineering Research Papers

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