Brunel University Research Archive (BURA) >
Schools >
School of Engineering and Design >
School of Engineering and Design Research papers >

Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/1321

Title: Residual stress field of HIPed silicon nitride rolling elements
Authors: Kang, J
Hadfield, M
Tobe, S
Keywords: Surfaces
Fatigue
Si3N4
Roughness
X-ray methods
Residual stress
Eccentric lapping machine
Advanced ceramic balls
Contact
Fnishing
Publication Date: 2002
Publisher: Elsevier
Citation: Kang, J., Hadfield, M. and. Tobe S., “Residual stress field of HIPed silicon nitride rolling elements
Abstract: The residual stress field of HIPed Si3N4 rolling elements were studied. Two kinds of HIPed Si3N4 ball blanks self-finished at different nominal lapping loads ranging from 1.3 to 10.87 kgf/ball and four kinds of commercially finished 1/2 in (12.7 mm) HIPed Si3N4 balls before, during and after RCF tests were investigated. The experimental results showed that in the finishing process of HIPed Si3N4 rolling elements. the surface and subsurface compressive residual stress induced is proportional to the lapping load applied. There was initially a high compressive residual stress layer on the HIPed Si3N4 ball blanks and this layer is mostly removed during the finishing process. During the rolling contact fatigue process of HIPed Si3N4 rolling elements, the residual stresses on the rolling track will change dramatically as RCF proceeds.
URI: www.elsevier.com/locate/inca/405926
http://bura.brunel.ac.uk/handle/2438/1321
ISSN: 0272-8842
Appears in Collections:Design
School of Engineering and Design Research papers
Mechanical Engineering

Files in This Item:

File Description SizeFormat
Residual stress field of HIPed silicon nitride all in one.pdf80.6 kBAdobe PDFView/Open

Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.

 


Library (c) Brunel University.    Powered By: DSpace
Send us your
Feedback. Last Updated: September 14, 2010.
Managed by:
Hassan Bhuiyan