Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/27909
Title: Towards Optimized Multi-Channel Modulo-Adcs: Moduli Selection Strategies And Bit Depth Analysis
Authors: Yan, W
Gan, L
Hu, S
Lui, H
Keywords: analog-to-digital converters (ADC);modulo samplers;Chinese remainder theorem (CRT)
Issue Date: 18-Mar-2024
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Yan, W.. et al. (2024) 'Towards Optimized Multi-Channel Modulo-Adcs: Moduli Selection Strategies And Bit Depth Analysis', ICASSP 2024 - 2024 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), Seoul, South Korea, 14-19 April, pp. 9496 - 9500. doi: 10.1109/ICASSP48485.2024.10448478.
Abstract: This paper presents a theoretical analysis of multi-channel modulo analog-to-digital converters (ADCs) for high-dynamic range sampling under bounded noise. In particular, we derive the maximum error tolerance in terms of ADC dynamic range, signal dynamic range, and channel number. Additionally, we present closed-form expressions for ADC thresholds, ensuring near-optimal error resilience, and analyzing the minimal bit-depth needed for stable recovery. Compared to single-channel modulo ADCs, our approach achieves superior error tolerance with reduced sampling rates. Moreover, it demands a minor bit rate increase compared to conventional ADCs but operates with a significantly smaller ADC dynamic range.
URI: https://bura.brunel.ac.uk/handle/2438/27909
DOI: https://doi.org/10.1109/ICASSP48485.2024.10448478
ISSN: 1520-6149
Other Identifiers: ORCiD: Lu Gan https://orcid.org/0000-0003-1056-7660
ORCiD: Shaoqing Hu https://orcid.org/0000-0001-8642-2914
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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