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Title: Instabilities in free-surface electroosmotic flows
Authors: Joo, SW
2nd Micro and Nano Flows Conference (MNF2009)
Keywords: Electroosmosis;Free surface;Instability;Rupture
Issue Date: 2009
Publisher: Brunel University
Citation: 2nd Micro and Nano Flows Conference, Brunel University, West London, UK, 01-02 September 2009
Abstract: With the recent development of novel microfluidic devices electroosmotic flows with fluid/fluid interfaces have emerged as very important subjects of investigation. Two immiscible fluids may need to be transported in a microchannel, or one side of a channel may be open to air for various purposes, including adsorption of airborne molecules to liquid for high-sensitivity substance detection. The liquid/liquid or liquid/gas interface in these cases can deform, resulting in significant corrugations followed sometimes by incipient rupture of liquid layers. For electroosmotic flow the rupture, leading to shortcircuit, can cause overall failure of the device. It is thus imperative to know the conditions for the rupture as well as the initial interfacial instability. Studies based on the Debye-Huckle approximation reveal that all free-surface electroosmotic flows of thickness larger than the Debye screening length are unstable and selectively lead to rupture. Layers of the order of Debye screening length, however, are not properly described by the Debye-Huckle approximation. Even for micro-scale layers, the rupture phenomenon can make local layer thickness to be nanoscale. A fully coupled system of hydrodynamics, electric field, and ionic distribution need to be analyzed. In this paper linear instability and subsequent nonlinear developments of a nanoscale free-surface electroosmotic flow are reported.
Description: This paper was presented at the 2nd Micro and Nano Flows Conference (MNF2009), which was held at Brunel University, West London, UK. The conference was organised by Brunel University and supported by the Institution of Mechanical Engineers, IPEM, the Italian Union of Thermofluid dynamics, the Process Intensification Network, HEXAG - the Heat Exchange Action Group and the Institute of Mathematics and its Applications.
ISBN: 978-1-902316-72-7
Appears in Collections:Brunel Institute for Bioengineering (BIB)
The Brunel Collection

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