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Title: Retention of data in heat-damaged SIM cards and potential recovery methods
Authors: Jones, BJ
Kenyon, AJ
Keywords: SIM card;Mobile phone;Fire;Data recovery;Scanning probe microscopy
Issue Date: 2007
Publisher: Elsevier BV
Citation: Forensic Sci. Int. 177: 42, Dec 2007
Abstract: Examination of various SIM cards and smart card devices indicates that data may be retained in SIM card memory structures even after heating to temperatures up to 450oC, which the National Institute of Standards and Technology (NIST) has determined to be approximately the maximum average sustained temperature at desk height in a house fire. However, in many cases, and certainly for temperatures greater than 450oC, the SIM card chip has suffered structural or mechanical damage that renders simple probing or rewiring ineffective. Nevertheless, this has not necessarily affected the data, which is stored as charge in floating gates, and alternative methods for directly accessing the stored charge may be applicable.
Appears in Collections:Materials Engineering
The Experimental Techniques Centre

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