Browsing by Subject YOLO-v5
Showing results 1 to 1 of 1
Issue Date | Title | Author(s) |
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21-May-2021 | Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once | Adibhatla, VA; Chih, H-C; Hsu, C-C; Cheng, J; Abbod, MF; Shieh, J-S |