Browsing by Author Abu Ebayyeh, AARM

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Showing results 1 to 6 of 6
Issue DateTitleAuthor(s)
10-May-2024Advancements in PCB Components Recognition Using WaferCaps: A Data Fusion and Deep Learning ApproachStarodubov, D; Danishvar, S; Abu Ebayyeh, AARM; Mousavi, A
22-Aug-2022Defect detection on optoelectronical devices to assist decision making: A real industry 4.0 case studyMoustris, GP; Kouzas, G; Fourakis, S; Fiotakis, G; Chondronasios, A; Abu Ebayyeh, AARM; Mousavi, A; Apostolou, K; Milenkovic, J; Chatzichristodoulou, Z; Beckert, E; Butet, J; Blaser, S; Landry, O; Müller, A
10-Dec-2021An Improved Capsule Network (WaferCaps) for Wafer Bin Map Classification Based on DCGAN Data UpsamplingAbu Ebayyeh, AARM; Danishvar, S; Mousavi, A
25-Oct-2022Printed Circuit Board Inspection: Fusion of Optical and X-ray Images (FOXi) for Electronic Components ClassificationStarodubov, D; Danishvar, S; Ott, R; Abu Ebayyeh, AARM; Cummings, N; Mousavi, A
6-Oct-2020A Review and Analysis of Automatic Optical Inspection and Quality Monitoring Methods in Electronics IndustryAbu Ebayyeh, AARM; Mousavi, A
11-Aug-2022Waveguide quality inspection in quantum cascade lasers: A capsule neural network approachAbu Ebayyeh, AARM; Mousavi, A; Danishvar, S; Blaser, S; Gresch, T; Landry, O; Müller, A