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dc.contributor.authorAttard-Montalto, N-
dc.contributor.authorOjeda, JJ-
dc.contributor.authorReynolds, A-
dc.contributor.authorIsmail, M-
dc.contributor.authorBailey, M-
dc.contributor.authorDoodkorte, L-
dc.contributor.authorDe Puit, M-
dc.contributor.authorJones, BJ-
dc.identifier.citationAnalyst, 139 (18): 4641 - 4653, (2014)en_US
dc.descriptionThis article is licensed under a Creative Commons Attribution 3.0 Unported Licenceen_US
dc.description.abstractThis study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface. Our experimental work has demonstrated that mapping selected endogenous components present in natural fingermarks enables the observation of friction ridges on a laser-printed surface, only when a fingerprint is deposited over this layer of ink. Further investigations have shown limited success on ink-jet printing and ballpoint pen inks. 51 blind tests carried out on natural, latent fingermarks on laser-printed surfaces; up to 14th depletion with samples aged for up to 421 days have resulted in a 100% success rate. Development with ninhydrin was found to affect the fingermark residue through mobilisation of ions, therefore sequencing determination was compromised; whilst iodine fuming and 1,2-indanedione developers did not. This implied that selected development methods affected success in fingermark-ink deposition order determination. These results were further corroborated through inter-laboratory validation studies. The adopted protocol and extensive series of tests have therefore demonstrated the effectiveness and limitations of ToF-SIMS in providing chronological sequencing information of fingermarks on questioned documents; successfully resolving this order of deposition query.en_US
dc.description.sponsorshipThis project is supported by funding from The Leverhulme Trust (RPG-138). The study design, analysis, interpretation and reporting were conducted by the authors with no involvement from The Trust.en_US
dc.format.extent4641 - 4653-
dc.format.extent4641 - 4653-
dc.publisherRoyal Society of Chemistryen_US
dc.subjectTime-of-flight secondary ion mass spectrometry (ToF-SIMS)en_US
dc.subjectPorous paperen_US
dc.subjectEndogenous componentsen_US
dc.titleDetermining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometryen_US
pubs.organisational-data/Brunel/Brunel Staff by Institute/Theme-
pubs.organisational-data/Brunel/Brunel Staff by Institute/Theme/Institute of Materials and Manufacturing-
pubs.organisational-data/Brunel/Brunel Staff by Institute/Theme/Institute of Materials and Manufacturing/Materials Characterisation and Processing-
pubs.organisational-data/Brunel/Research Staff not Allocated to a College-
pubs.organisational-data/Brunel/Research Staff not Allocated to a College/Experimental Techniques Centre-
pubs.organisational-data/Brunel/Specialist Centres-
pubs.organisational-data/Brunel/Specialist Centres/ETC-
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