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http://bura.brunel.ac.uk/handle/2438/10723
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Holloway, AF | - |
dc.contributor.author | Nabok, A | - |
dc.contributor.author | Thompson, M | - |
dc.contributor.author | Ray, AK | - |
dc.contributor.author | Crowther, D | - |
dc.contributor.author | Siddiqi, J | - |
dc.date.accessioned | 2015-05-01T13:15:36Z | - |
dc.date.available | 2003-06 | - |
dc.date.available | 2015-05-01T13:15:36Z | - |
dc.date.issued | 2003 | - |
dc.identifier.citation | SENSORS, 2003, 3 (6), pp. 187 - 191 | en_US |
dc.identifier.issn | 1424-8220 | - |
dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/10723 | - |
dc.description.abstract | The Impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption. | en_US |
dc.format.extent | 187 - 191 | - |
dc.language | EN | - |
dc.language.iso | en | en_US |
dc.publisher | MOLECULAR DIVERSITY PRESERVATION INTERNATIONAL | en_US |
dc.subject | Impedance analysis | en_US |
dc.subject | QCM | en_US |
dc.subject | TSM resonator | en_US |
dc.subject | BVD model | en_US |
dc.subject | Films | en_US |
dc.title | New method of vapour discrimination using the Thickness Shear Mode (TSM) resonator | en_US |
dc.type | Article | en_US |
dc.relation.isPartOf | SENSORS | - |
pubs.issue | 6 | - |
pubs.issue | 6 | - |
pubs.volume | 3 | - |
pubs.volume | 3 | - |
Appears in Collections: | Wolfson Centre for Sustainable Materials Development and Processing |
Files in This Item:
File | Description | Size | Format | |
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FullText.pdf | 182.43 kB | Adobe PDF | View/Open |
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