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Issue Date | Title | Author(s) |
---|---|---|
2010 | Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements | Bodea, MA; Pedarnig, JD; Withnell, TD; Weber, HW; Cardwell, DA; Hari Babu, N; Koblischka-Veneva, A |