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http://bura.brunel.ac.uk/handle/2438/21021Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Danishvar, M | - |
| dc.contributor.author | Angadi, VC | - |
| dc.contributor.author | Mousavi, A | - |
| dc.coverage.spatial | Vancouver, BC, Canada | - |
| dc.date.accessioned | 2020-06-17T22:51:01Z | - |
| dc.date.available | 2020-06-17T22:51:01Z | - |
| dc.date.issued | 2020-08-20 | - |
| dc.identifier.citation | Danishvar, M., Angadi, V.C. and Mousavi, A. (2020) 'A PdM framework Through the Event-based Genomics of Machine Breakdown', Proceedings of the 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling (APARM), Vancouver, BC, Canada, 20-23 August, pp. 1 - 6. doi: 10.1109/APARM49247.2020.9209530. | - |
| dc.identifier.isbn | 978-1-7281-7102-9 (ebk) | - |
| dc.identifier.isbn | 978-1-7281-7103-6 (PoD) | - |
| dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/21021 | - |
| dc.format.extent | 1 - 6 | - |
| dc.format.medium | Print-Electronic | - |
| dc.language.iso | en | en_US |
| dc.rights | Copyright © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. See: https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/. | - |
| dc.rights.uri | https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ | - |
| dc.source | The 9th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modelling 2020 | - |
| dc.source | The 9th Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modelling 2020 | - |
| dc.subject | real-time Event Sequencing | en_US |
| dc.subject | genomics of Machine Breakdown | en_US |
| dc.subject | predictive Maintenance | en_US |
| dc.subject | regressive Event Tracker | en_US |
| dc.subject | RUL | en_US |
| dc.subject | machine learning | en_US |
| dc.subject | compression moulding machine | en_US |
| dc.title | A PdM framework Through the Event-based Genomics of Machine Breakdown | en_US |
| dc.type | Conference Paper | en_US |
| dc.identifier.doi | https://doi.org/10.1109/APARM49247.2020.9209530 | - |
| pubs.finish-date | 2020-08-23 | - |
| pubs.finish-date | 2020-08-23 | - |
| pubs.publication-status | Published | - |
| pubs.start-date | 2020-08-20 | - |
| pubs.start-date | 2020-08-20 | - |
| dc.rights.holder | IEEE | - |
| Appears in Collections: | Dept of Electronic and Electrical Engineering Research Papers | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | Copyright © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. See: https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/. | 789.49 kB | Adobe PDF | View/Open |
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