Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/21596
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Adibhatla, VA | - |
dc.contributor.author | Chih, H-C | - |
dc.contributor.author | Hsu, C-C | - |
dc.contributor.author | Cheng, J | - |
dc.contributor.author | Abbod, M | - |
dc.contributor.author | Shieh, JS | - |
dc.date.accessioned | 2020-09-26T15:59:08Z | - |
dc.date.available | 2020-09-26T15:59:08Z | - |
dc.date.issued | 2020-09-22 | - |
dc.identifier | 1547 | - |
dc.identifier.citation | Adibhatla, V.A.; Chih, H.-C.; Hsu, C.-C.; Cheng, J.; Abbod, M.F.; Shieh, J.-S. Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks. Electronics 2020, 9, 1547, pp. 1-16. doi: 10.3390/electronics9091547. | en_US |
dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/21596 | - |
dc.description.abstract | © 2020 by the authors. In this study, a deep learning algorithm based on the you-only-look-once (YOLO) approach is proposed for the quality inspection of printed circuit boards (PCBs). The high accuracy and efficiency of deep learning algorithms has resulted in their increased adoption in every field. Similarly, accurate detection of defects in PCBs by using deep learning algorithms, such as convolutional neural networks (CNNs), has garnered considerable attention. In the proposed method, highly skilled quality inspection engineers first use an interface to record and label defective PCBs. The data are then used to train a YOLO/CNN model to detect defects in PCBs. In this study, 11,000 images and a network of 24 convolutional layers and 2 fully connected layers were used. The proposed model achieved a defect detection accuracy of 98.79% in PCBs with a batch size of 32. | en_US |
dc.description.sponsorship | Ministry of Science and Technology of Taiwan; Boardtek Electronics Corporation, Taiwan | en_US |
dc.format.extent | 1 - 16 (16) | - |
dc.language | English | - |
dc.language.iso | en | en_US |
dc.publisher | MDPI | en_US |
dc.rights | Copyright © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). | - |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | - |
dc.subject | convolution neural network | en_US |
dc.subject | YOLO | en_US |
dc.subject | deep learning | en_US |
dc.subject | printed circuit board | en_US |
dc.title | Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks | en_US |
dc.type | Article | en_US |
dc.identifier.doi | https://doi.org/10.3390/electronics9091547 | - |
dc.relation.isPartOf | Electronics | - |
pubs.issue | 9 | - |
pubs.publication-status | Published online | - |
pubs.volume | 9 | - |
dc.identifier.eissn | 1450-5843 | - |
Appears in Collections: | Dept of Electronic and Electrical Engineering Research Papers |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
FullText.pdf | 3.58 MB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License