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DC Field | Value | Language |
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dc.contributor.author | Lai, CS | - |
dc.date.accessioned | 2021-05-24T11:27:35Z | - |
dc.date.available | 2016-01-12 | - |
dc.date.available | 2021-05-24T11:27:35Z | - |
dc.date.issued | 2015 | - |
dc.identifier.citation | Proceedings - 2015 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015, 2016, pp. 653 - 658 | en_US |
dc.identifier.isbn | 9781479986965 | - |
dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/22754 | - |
dc.description.abstract | Detecting and identifying High Impedance Fault (HIF) in distribution system is an essential task for a secure and reliable grid. The ability for relaying system to differentiate HIF and heavy load condition is still a challenging problem as their current and voltage characteristics are very similar. This paper demonstrates how discrete wavelet transform can be used to identify the two cases. It also reviews how big data analytics could be used to improve this long standing problem. A simple power system model constructed in Dig SILENT Power Factory performs the short circuit analysis for the HIF and the open circuit islanding for the heavy load conditions. MATLAB will be used for discrete wavelet transform analysis for the output from the power system model. | en_US |
dc.format.extent | 653 - 658 | - |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.rights | © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | - |
dc.subject | High Impedance Fault | en_US |
dc.subject | Heavy Load | en_US |
dc.subject | Big Data | en_US |
dc.subject | Grid Analytics | en_US |
dc.title | High Impedance Fault and Heavy Load under Big Data Context | en_US |
dc.type | Conference Paper | en_US |
dc.identifier.doi | http://dx.doi.org/10.1109/SMC.2015.124 | - |
dc.relation.isPartOf | Proceedings - 2015 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015 | - |
pubs.publication-status | Published | - |
Appears in Collections: | Dept of Electronic and Electrical Engineering Research Papers |
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FullText.pdf | 637.52 kB | Adobe PDF | View/Open |
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