Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/22754
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dc.contributor.authorLai, CS-
dc.date.accessioned2021-05-24T11:27:35Z-
dc.date.available2016-01-12-
dc.date.available2021-05-24T11:27:35Z-
dc.date.issued2015-
dc.identifier.citationProceedings - 2015 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015, 2016, pp. 653 - 658en_US
dc.identifier.isbn9781479986965-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/22754-
dc.description.abstractDetecting and identifying High Impedance Fault (HIF) in distribution system is an essential task for a secure and reliable grid. The ability for relaying system to differentiate HIF and heavy load condition is still a challenging problem as their current and voltage characteristics are very similar. This paper demonstrates how discrete wavelet transform can be used to identify the two cases. It also reviews how big data analytics could be used to improve this long standing problem. A simple power system model constructed in Dig SILENT Power Factory performs the short circuit analysis for the HIF and the open circuit islanding for the heavy load conditions. MATLAB will be used for discrete wavelet transform analysis for the output from the power system model.en_US
dc.format.extent653 - 658-
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.rights© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.    -
dc.subjectHigh Impedance Faulten_US
dc.subjectHeavy Loaden_US
dc.subjectBig Dataen_US
dc.subjectGrid Analyticsen_US
dc.titleHigh Impedance Fault and Heavy Load under Big Data Contexten_US
dc.typeConference Paperen_US
dc.identifier.doihttp://dx.doi.org/10.1109/SMC.2015.124-
dc.relation.isPartOfProceedings - 2015 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2015-
pubs.publication-statusPublished-
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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