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DC Field | Value | Language |
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dc.contributor.author | Behrman, K | - |
dc.contributor.author | Fouilloux, J | - |
dc.contributor.author | Ireland, T | - |
dc.contributor.author | Fern, GR | - |
dc.contributor.author | Silver, J | - |
dc.contributor.author | Kymissis, I | - |
dc.date.accessioned | 2024-06-13T14:12:03Z | - |
dc.date.available | 2024-06-13T14:12:03Z | - |
dc.date.issued | 2021-02-05 | - |
dc.identifier | ORCiD: Terry Ireland https://orcid.org/0000-0001-6512-9540 | - |
dc.identifier | ORCiD: George R. Fern https://orcid.org/0000-0002-0016-5038 | - |
dc.identifier | ORCiD: Jack Silver https://orcid.org/0000-0001-8669-9673 | - |
dc.identifier.citation | Behrman, K. et al. (2021) 'Early defect identification for micro light-emitting diode displays via photoluminescent and cathodoluminescent imaging', Journal of the Society for Information Display, 29 (4), pp. 264 - 274. doi: 10.1002/jsid.985. | - |
dc.identifier.issn | 1071-0922 | - |
dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/29170 | - |
dc.description.abstract | Ultrahigh-resolution micro light-emitting diode (LED) displays are emerging as a viable technology for self-emissive displays. Several of the critical issues facing micro LED displays with millions of pixels are fidelity, process control, and defect analysis during LED fabrication and transfer. Here, we investigate two non-destructive test methods, photoluminescent and cathodoluminescent imaging, and compare them with electroluminescent images to verify LED fidelity and evaluate these methods as potential tools for defect analysis. We show that utilizing cathodoluminescent imaging as an analysis tool provides a rich data set that can identify and categorize common defects during micro LED display fabrication that correspond to electroluminescence. Photoluminescent imaging, however, is not an effective method for fidelity analysis but does provide information on dry-etching uniformity. | - |
dc.format.extent | 264 - 274 | - |
dc.language | English | - |
dc.rights | Copyright © 2021 Society for Information Display. Published by Wiley. This is the peer reviewed version of the following article: Behrman, K. et al. (2021) 'Early defect identification for micro light-emitting diode displays via photoluminescent and cathodoluminescent imaging', Journal of the Society for Information Display, 29 (4), pp. 264 - 274, which has been published in final form at https://doi.org/10.1002/jsid.985. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions (see: https://authorservices.wiley.com/author-resources/Journal-Authors/licensing/self-archiving.html). | - |
dc.rights.uri | https://authorservices.wiley.com/author-resources/Journal-Authors/licensing/self-archiving.html | - |
dc.subject | cathodoluminescence | - |
dc.subject | defect analysis | - |
dc.subject | micro LED | - |
dc.subject | photoluminescence | - |
dc.subject | pixel transfer | - |
dc.subject | quality control | - |
dc.title | Early defect identification for micro light-emitting diode displays via photoluminescent and cathodoluminescent imaging | - |
dc.type | Journal Article | - |
dc.date.dateAccepted | 2020-12-17 | - |
dc.identifier.doi | https://doi.org/10.1002/jsid.985 | - |
dc.relation.isPartOf | Journal of the Society for Information Display | - |
pubs.issue | 4 | - |
pubs.publication-status | Published | - |
pubs.volume | 29 | - |
dc.identifier.eissn | 1938-3657 | - |
dc.rights.holder | Society for Information Display | - |
Appears in Collections: | Dept of Chemical Engineering Research Papers |
Files in This Item:
File | Description | Size | Format | |
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FullText.pdf | Copyright © 2021 Society for Information Display. Published by Wiley. This is the peer reviewed version of the following article: Behrman, K. et al. (2021) 'Early defect identification for micro light-emitting diode displays via photoluminescent and cathodoluminescent imaging', Journal of the Society for Information Display, 29 (4), pp. 264 - 274, which has been published in final form at https://doi.org/10.1002/jsid.985. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Use of Self-Archived Versions (see: https://authorservices.wiley.com/author-resources/Journal-Authors/licensing/self-archiving.html). | 40.35 MB | Adobe PDF | View/Open |
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