Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/31364
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMalin, B-
dc.contributor.authorKalganova, T-
dc.contributor.authorBoulgouris, N-
dc.date.accessioned2025-05-31T16:46:50Z-
dc.date.available2025-05-31T16:46:50Z-
dc.date.issued2025-06-12-
dc.identifierORCiD: Tatiana Kalganova https://orcid.org/0000-0003-4859-7152-
dc.identifierORCiD: Nikolaos Boulgouris https://orcid.org/0000-0002-5382-6856-
dc.identifier.citationMalin, B., Kalganova, T. and Boulgouris, N. (2025) 'A review of faithfulness metrics for hallucination assessment in Large Language Models', IEEE Journal of Selected Topics in Signal Processing, 0 (Early Access, Special Issue), pp. 1 - 13. doi: 10.1109/JSTSP.2025.3579203.en_US
dc.identifier.issn1932-4553-
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/31364-
dc.descriptionThis article has been accepted for publication in IEEE Journal of Selected Topics in Signal Processing. This is the author's version which has not been fully edited and content may change prior to final publication. Citation information: DOI 10.1109/JSTSP.2025.3579203 .en_US
dc.description.abstractThis review examines the means with which faithfulness has been evaluated across open-ended summarization, question answering and machine translation tasks. We find that the use of Large Language Models (LLMs) as a faithfulness evaluator is commonly the metric that is most highly correlated with human judgement. The means with which other studies have mitigated hallucinations is discussed, with both retrieval augmented generation (RAG) and prompting framework approaches having been linked with superior faithfulness, whilst other recommendations for mitigation are provided. Research into faithfulness is integral to the continued widespread use of LLMs, as unfaithful responses can pose major risks to many areas whereby LLMs would otherwise be suitable. Furthermore, evaluating open-ended generation provides a more comprehensive measure of LLM performance than commonly used multiplechoice benchmarking, which can help in advancing the trust that can be placed within LLMs.en_US
dc.description.sponsorship10.13039/501100000780-European Commission. This work has been funded by the European Union.en_US
dc.format.extent1 - 13-
dc.format.mediumPrint-Electronic-
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsCopyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.rights.urihttps://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.subjectevaluationen_US
dc.subjectfact extractionen_US
dc.subjectfaithfulnessen_US
dc.subjecthallucinationen_US
dc.subjectLLMen_US
dc.subjectmachine translationen_US
dc.subjectquestion answeringen_US
dc.subjectRAGen_US
dc.subjectsummarizationen_US
dc.titleA review of faithfulness metrics for hallucination assessment in Large Language Modelsen_US
dc.typeArticleen_US
dc.date.dateAccepted2025-05-30-
dc.identifier.doihttps://doi.org/10.1109/JSTSP.2025.3579203-
dc.relation.isPartOfIEEE Journal of Selected Topics in Signal Processing-
pubs.issueSPECIAL ISSUE-
pubs.issue00-
pubs.publication-statusPublished online-
pubs.volume0-
dc.identifier.eissn1941-0484-
dcterms.dateAccepted2025-05-30-
dc.rights.holderInstitute of Electrical and Electronics Engineers (IEEE)-
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

Files in This Item:
File Description SizeFormat 
FullText.pdfCopyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/1.22 MBAdobe PDFView/Open


Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.