Please use this identifier to cite or link to this item: https://bura.brunel.ac.uk/handle/2438/33905
Title: Moduli Selection in Robust Chinese Remainder Theorem: Closed-Form Solutions and Layered Design
Authors: Yan, Wenyi
Gan, Lu
Liu, Hongqing
Hu, Shaoqing
Keywords: Chinese remainder theorem (CRT);moduli construction;multi-level error tolerance;dynamic range;robustness
Issue Date: 14-Aug-2026
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Yan, W. et al. (2026) 'Moduli Selection in Robust Chinese Remainder Theorem: Closed-Form Solutions and Layered Design', IEEE Transactions on Information Theory, 72(10), pp. 7258–7274. doi: 10.1109/tit.2026.3723974.
Abstract: We study the fundamental problem of moduli selection in the Robust Chinese Remainder Theorem (RCRT), where each residue may be perturbed by a bounded error. Consider L moduli of the form m<inf>i</inf> = Γ<inf>i</inf>m (1 ≤ i ≤ L), where Γ<inf>i</inf> are pairwise coprime integers and m ∈ R<sup>+</sup> is a common scaling factor. For small L (L = 2, 3, 4), we obtain exact solutions that maximise the robustness margin under dynamic-range and modulus-bound constraints. We also introduce a Fibonacci-inspired layered construction (for L = 2) that produces exactly K robust decoding layers, enabling predictable trade-offs between error tolerance and dynamic range. We further analyse how robustness and range evolve across layers and provide a closed-form expression to estimate the success probability under common data and noise models. The results are promising for various applications, such as sub-Nyquist sampling, phase unwrapping, range estimation, modulo analog-to-digital converters (ADCs), and robust residue-number-system (RNS)-based accelerators for deep learning. Our framework thus establishes a general theory of moduli design for RCRT, complementing prior algorithmic work and underscoring the broad relevance of robust moduli design across diverse information-processing domains.
URI: https://bura.brunel.ac.uk/handle/2438/33905
DOI: https://doi.org/10.1109/tit.2026.3723974
ISSN: 0018-9448
Appears in Collections:Department of Electronic and Electrical Engineering Research Papers

Files in This Item:
File Description SizeFormat 
FullText.pdfCopyright ‘For the purpose of open access, the author has applied a ‘Creative Commons Attribution (CC BY) licence to any Author Accepted Manuscript version arising.’2.17 MBAdobe PDFView/Open


This item is licensed under a Creative Commons License Creative Commons