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https://bura.brunel.ac.uk/handle/2438/34180| Title: | Assessing Short Circuit Levels as a Measure of System Strength in Future Grids with Uneven Distribution of Inertia and High Percentages of IBR |
| Authors: | Sommerville, Stephen Taylor, Gareth A Aunedi, Marko |
| Keywords: | EMT;fault level;inertia;RMS and SCR |
| Issue Date: | 27-Jul-2025 |
| Publisher: | Institute of Electrical and Electronics Engineers (IEEE) |
| Citation: | Sommerville, S., Taylor, P.G.A. and Marko Aunedi, D. (2025) 'Assessing Short Circuit Levels as a Measure of System Strength in Future Grids with Uneven Distribution of Inertia and High Percentages of IBR', 2025 IEEE Power & Energy Society General Meeting (PESGM), Austin, TX, USA, 27–31 July, pp. 1–5. doi: 10.1109/pesgm52009.2025.11225458. |
| Abstract: | In power system analysis the system strength and suitability for connection of Inverter Based Resource (IBR) generation and disturbing loads is considered in terms of fault level and Short Circuit Ratio (SCR). This paper shows that with the increasing penetration of IBR and changes to the distribution of system inertia, such an approach overestimates system strength. This paper proposes an alternative approach using time domain Root Mean Square (RMS) / Electromagnetic Transient (EMT) simulation methods to analyse the system's ability to deliver energy over time in relation to small perturbations. This is demonstrated through the use of a test network, where uneven inertia distribution and increased fault levels due to IBR are shown to give misleading results. |
| URI: | https://bura.brunel.ac.uk/handle/2438/34180 |
| DOI: | https://doi.org/10.1109/pesgm52009.2025.11225458 |
| ISBN: | 9798331509958 9798331509965 |
| ISSN: | 1944-9925 |
| Appears in Collections: | Department of Electronic and Electrical Engineering Research Papers |
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| FullText.pdf | Copyright ‘For the purpose of open access, the author has applied a ‘Creative Commons Attribution (CC BY) licence to any Author Accepted Manuscript version arising.’ | 3.45 MB | Adobe PDF | View/Open |
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