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Issue DateTitleAuthor(s)
22-Sep-2020Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural NetworksAdibhatla, VA; Chih, H-C; Hsu, C-C; Cheng, J; Abbod, M; Shieh, JS
21-May-2021Applying deep learning to defect detection in printed circuit boards via a newest model of you-only-look-onceAdibhatla, VA; Chih, H-C; Hsu, C-C; Cheng, J; Abbod, MF; Shieh, J-S