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Issue Date | Title | Author(s) |
---|---|---|
2022 | Deep learning for automatic optical inspection and quality evaluation of semiconductor and optoelectronic manufacturing | Abu Ebayyeh, Abd Al Rahman M. |
15-Apr-2022 | Knowledge-based and data-driven approaches for assessing greenhouse gas emissions from wastewater systems | Porro, J; Vasilaki, V; Bellandi, G; Katsou, E |