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Issue Date | Title | Author(s) |
---|---|---|
22-Sep-2020 | Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks | Adibhatla, VA; Chih, H-C; Hsu, C-C; Cheng, J; Abbod, M; Shieh, JS |
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- 1 2020