Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/9257
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dc.contributor.authorAnastasiou, AD-
dc.contributor.authorGavriilidis, A-
dc.contributor.authorMouza, AA-
dc.contributor.author4th Micro and Nano Flows Conference (MNF2014)-
dc.date.accessioned2014-12-01T17:01:38Z-
dc.date.available2014-12-01T17:01:38Z-
dc.date.issued2014-
dc.identifier.citation4th Micro and Nano Flows Conference, University College London, UK, 7-10 September 2014, Editors CS König, TG Karayiannis and S. Balabanien_US
dc.identifier.isbn978-1-908549-16-7-
dc.identifier.urihttp://bura.brunel.ac.uk/handle/2438/9257-
dc.descriptionThis paper was presented at the 4th Micro and Nano Flows Conference (MNF2014), which was held at University College, London, UK. The conference was organised by Brunel University and supported by the Italian Union of Thermofluiddynamics, IPEM, the Process Intensification Network, the Institution of Mechanical Engineers, the Heat Transfer Society, HEXAG - the Heat Exchange Action Group, and the Energy Institute, ASME Press, LCN London Centre for Nanotechnology, UCL University College London, UCL Engineering, the International NanoScience Community, www.nanopaprika.eu.en_US
dc.description.abstractFalling Film Microreactor (FFMR) is one of the most important microfluidic devices for gasliquid applications. In these devices extended specific surfaces (up to 20,000m2/m3) can be obtained while the liquid film remains stable over a wide range of gas and liquid flow rates. In an effort to propose new design correlations for these devices, in a previous work we proposed correlations for the prediction of the gasliquid interface and the thickness of the liquid film. In this study we aim to investigate the validity of these correlations when different channel materials are used, namely brass and silicon. Velocity profiles have been also obtained by a μ-PIV system, while the thickness of the liquid film and the shape of the interface were also determined using the μ-PIV system. It was proved that the shape of the interface can be predicted with reasonable accuracy by the previously proposed correlations. Also the film thickness can be predicted with acceptable accuracy provided that some of the constants are modified according to the material of the test section.en_US
dc.language.isoenen_US
dc.publisherBrunel University Londonen_US
dc.relation.ispartofseriesID14-
dc.subjectMicroreactoren_US
dc.subjectFalling filmen_US
dc.subjectμ-PIVen_US
dc.subjectFilm thicknessen_US
dc.titlePrediction of the liquid film characteristics in open inclined microchannelsen_US
dc.typeConference Paperen_US
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