Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/10716
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Bodea, MA | - |
dc.contributor.author | Pedarnig, JD | - |
dc.contributor.author | Withnell, TD | - |
dc.contributor.author | Weber, HW | - |
dc.contributor.author | Cardwell, DA | - |
dc.contributor.author | Hari Babu, N | - |
dc.contributor.author | Koblischka-Veneva, A | - |
dc.date.accessioned | 2015-05-01T10:30:12Z | - |
dc.date.available | 2010 | - |
dc.date.available | 2015-05-01T10:30:12Z | - |
dc.date.issued | 2010 | - |
dc.identifier.citation | Journal of Physics: Conference Series, 2010, 234 (PART 1) | en_US |
dc.identifier.issn | 1742-6588 | - |
dc.identifier.issn | 1742-6596 | - |
dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/10716 | - |
dc.description.abstract | Thin films of nano-composite Y-Ba-Cu-O (YBCO) superconductors containing nano-sized, non-superconducting particles of Y2Ba 4CuMOx (M-2411 with M = Ag and Nb) have been prepared by the PLD technique. Electron backscatter diffraction (EBSD) has been used to analyze the crystallographic orientation of nano-particles embedded in the film microstructure. The superconducting YBa2Cu3O7 (Y-123) phase matrix is textured with a dominant (001) orientation for all samples, whereas the M-2411 phase exhibits a random orientation. Angular critical current measurements at various temperature (T) and applied magnetic field (B) have been performed on thin films containing different concentration of the M-2411 second phase. An increase in critical current density J c at T < 77 K and B < 6 T is observed for samples with low concentration of the second phase (2 mol % M-2411). Films containing 5 mol % Ag-2411 exhibit lower Jc than pure Y-123 thin films at all fields and temperatures. Samples with 5 mol % Nb-2411 show higher Jc(B) than phase pure Y-123 thin films for T < 77 K. | en_US |
dc.language | eng | - |
dc.language.iso | en | en_US |
dc.subject | Nano-Composite | en_US |
dc.subject | Superconductors | en_US |
dc.subject | Electron backscatter Diffraction | en_US |
dc.title | Characterization of nano-composite M-2411/Y-123 thin films by electron backscatter diffraction and in-field critical current measurements | en_US |
dc.type | Article | en_US |
dc.identifier.doi | http://dx.doi.org/10.1088/1742-6596/234/1/012006 | - |
dc.relation.isPartOf | Journal of Physics: Conference Series | - |
pubs.issue | PART 1 | - |
pubs.issue | PART 1 | - |
pubs.volume | 234 | - |
pubs.volume | 234 | - |
Appears in Collections: | Brunel Centre for Advanced Solidification Technology (BCAST) |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
FullText.pdf | 678.69 kB | Adobe PDF | View/Open |
Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.