Please use this identifier to cite or link to this item:
Title: New method of vapour discrimination using the Thickness Shear Mode (TSM) resonator
Authors: Holloway, AF
Nabok, A
Thompson, M
Ray, AK
Crowther, D
Siddiqi, J
Keywords: Impedance analysis;QCM;TSM resonator;BVD model;Films
Issue Date: 2003
Citation: SENSORS, 2003, 3 (6), pp. 187 - 191
Abstract: The Impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption.
ISSN: 1424-8220
Appears in Collections:Wolfson Centre for Materials Processing

Files in This Item:
File Description SizeFormat 
FullText.pdf182.43 kBAdobe PDFView/Open

Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.