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|Title:||New method of vapour discrimination using the Thickness Shear Mode (TSM) resonator|
|Keywords:||Impedance analysis;QCM;TSM resonator;BVD model;Films|
|Publisher:||MOLECULAR DIVERSITY PRESERVATION INTERNATIONAL|
|Citation:||SENSORS, 2003, 3 (6), pp. 187 - 191|
|Abstract:||The Impedance analysis technique complemented with curve fitting software was used to monitor changes in film properties of Thickness Shear Mode (TSM) resonator on vapour exposure. The approach demonstrates how sensor selectivity can be achieved through unique changes in film viscosity caused by organic vapour adsorption.|
|Appears in Collections:||Wolfson Centre for Materials Processing|
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