Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/1081
Title: | Novel methods of fabrication and metrology of superconducting nanostructures |
Authors: | Hao, L Macfarlane, JC Gallop, JC Cox, DD Joseph-Franks, P Hutson, D Chen, JJ Lam, SKH |
Keywords: | Magnetic field effects;Nanotechnology;Superconducting devices;Thin films |
Issue Date: | 2007 |
Publisher: | IEEE |
Citation: | IEEE Transactions on Instrumentation and Measurement, 56(2): 392 - 396, Apr 2007 |
Abstract: | As metrology extends toward the nanoscale, a number of potential applications and new challenges arise. By combining photolithography with focused ion beam and/or electron beam methods, superconducting quantum interference devices (SQUIDs) with loop dimensions down to 200 nm and superconducting bridge dimensions of the order 80 nm have been produced. These SQUIDs have a range of potential applications. As an illustration, we describe a method for characterizing the effective area and the magnetic penetration depth of a structured superconducting thin film in the extreme limit, where the superconducting penetration depth $lambda$ is much greater than the film thickness and is comparable with the lateral dimensions of the device. |
URI: | http://bura.brunel.ac.uk/handle/2438/1081 |
DOI: | http://dx.doi.org/10.1109/TIM.2007.890593 |
Appears in Collections: | Dept of Mechanical and Aerospace Engineering Research Papers |
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