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|Title:||Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam|
|Keywords:||Science & Technology;Technology;Physical Sciences;Engineering, Electrical & Electronic;Physics, Applied;Engineering;Physics;Focused ion beam (FIB);microwave;nanoscale;nanoSQUID;superconducting QUantum Interference Device (SQUIDs);Xe FIB;QUANTUM INTERFERENCE DEVICE|
|Publisher:||IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC|
|Citation:||IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2018, 28 (7)|
|Abstract:||Superconducting QUantum Interference Devices (SQUIDs) based on nanobridge junctions have shown increasing promise for single particle detection. This paper describes the development of the fabrication of improved and reproducible nanobridge junctions fabricated by focused ion beam (FIB) milling from niobium thin films. Although the very low noise properties of nanobridge SQUIDs are well known, the nature of the milling process is little understood at the level of local superconducting properties. In this paper, we report the results for nanobridge Josephson devices and SQUIDs, which we believe are the first to be made by Xenon (Xe) FIB milling. Temperature-dependent current–voltage behavior, microwave-induced Shapiro steps, and SQUID response to magnetic fields have been measured. We make preliminary comparisons with nominally identical devices milled from Nb thin films using either Xe or Ga ions.|
|Appears in Collections:||Dept of Mechanical Aerospace and Civil Engineering Research Papers|
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