Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/16779
Title: Investigation of Dayem Bridge NanoSQUIDs Made by Xe Focused Ion Beam
Authors: Godfrey, T
Gallop, JC
Cox, DC
Romans, EJ
Chen, J
Hao, L
Keywords: Science & Technology;Technology;Physical Sciences;Engineering, Electrical & Electronic;Physics, Applied;Engineering;Physics;Focused ion beam (FIB);microwave;nanoscale;nanoSQUID;superconducting QUantum Interference Device (SQUIDs);Xe FIB;QUANTUM INTERFERENCE DEVICE
Issue Date: 2018
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2018, 28 (7)
Abstract: Superconducting QUantum Interference Devices (SQUIDs) based on nanobridge junctions have shown increasing promise for single particle detection. This paper describes the development of the fabrication of improved and reproducible nanobridge junctions fabricated by focused ion beam (FIB) milling from niobium thin films. Although the very low noise properties of nanobridge SQUIDs are well known, the nature of the milling process is little understood at the level of local superconducting properties. In this paper, we report the results for nanobridge Josephson devices and SQUIDs, which we believe are the first to be made by Xenon (Xe) FIB milling. Temperature-dependent current–voltage behavior, microwave-induced Shapiro steps, and SQUID response to magnetic fields have been measured. We make preliminary comparisons with nominally identical devices milled from Nb thin films using either Xe or Ga ions.
URI: http://bura.brunel.ac.uk/handle/2438/16779
DOI: http://dx.doi.org/10.1109/TASC.2018.2854624
ISSN: 1051-8223
1558-2515
2378-7074
Appears in Collections:Dept of Mechanical Aerospace and Civil Engineering Research Papers

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