Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/17771
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Adibhatla, VA | - |
dc.contributor.author | Shieh, JS | - |
dc.contributor.author | Abbod, MF | - |
dc.contributor.author | Chih, HC | - |
dc.contributor.author | Hsu, CC | - |
dc.contributor.author | Cheng, J | - |
dc.coverage.spatial | Taipei, Taiwan, Taiwan | - |
dc.date.accessioned | 2019-03-25T11:30:10Z | - |
dc.date.available | 2019-01-24 | - |
dc.date.available | 2019-03-25T11:30:10Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT, 2019, 2018-October pp. 202 - 205 | en_US |
dc.identifier.issn | 2150-5934 | - |
dc.identifier.issn | http://dx.doi.org/10.1109/IMPACT.2018.8625828 | - |
dc.identifier.uri | http://bura.brunel.ac.uk/handle/2438/17771 | - |
dc.format.extent | 202 - 205 | - |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.source | 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) | - |
dc.source | 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) | - |
dc.subject | Convolution | en_US |
dc.subject | Deep learning | en_US |
dc.subject | Training | en_US |
dc.subject | Inspection | en_US |
dc.title | Detecting defects in PCB using deep learning via convolution neural networks | en_US |
dc.type | Conference Paper | en_US |
dc.identifier.doi | http://dx.doi.org/10.1109/IMPACT.2018.8625828 | - |
dc.relation.isPartOf | Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT | - |
pubs.finish-date | 2018-10-26 | - |
pubs.finish-date | 2018-10-26 | - |
pubs.publication-status | Published | - |
pubs.start-date | 2018-10-24 | - |
pubs.start-date | 2018-10-24 | - |
pubs.volume | 2018-October | - |
Appears in Collections: | Dept of Electronic and Electrical Engineering Embargoed Research Papers |
Files in This Item:
File | Description | Size | Format | |
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FullText.pdf | Embargoed until 1/1/2030 | 650.32 kB | Adobe PDF | View/Open |
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