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Title: Testing of mixed-signal systems using dynamic stimuli
Authors: Taylor, D
Evans, PSA
Pritchard, TI
Keywords: Integrated circuits; Testing
Issue Date: 1993
Publisher: IEEE
Citation: IEE Electronics Lttrs Vol.29, No.9, April 1993. pp 811 - 813.
Abstract: The impulse response of a linear circuit element contains enough information to functionally characterise that element. A technique for comparison of observed and expected (reference) transient responses, which results in an absolute measure of device functionality, is presented. Comparisons of transient response test results with the results from existing test programs are also presented.
ISSN: 0013-5194
Appears in Collections:Design
Brunel Design School Research Papers

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