Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/20040| Title: | Applications of machine learning to machine fault diagnosis: A review and roadmap |
| Authors: | Lei, Y Yang, B Jiang, X Jia, F Li, N Nandi, AK |
| Keywords: | Machines;Intelligent fault diagnosis;Machine learning;Deep learning;Transfer learning |
| Issue Date: | 2020 |
| Publisher: | Elsevier |
| Citation: | Mechanical Systems and Signal Processing, 2020, 138 |
| URI: | http://bura.brunel.ac.uk/handle/2438/20040 |
| DOI: | http://dx.doi.org/10.1016/j.ymssp.2019.106587 |
| ISSN: | 0888-3270 http://dx.doi.org/10.1016/j.ymssp.2019.106587 1096-1216 |
| Appears in Collections: | Dept of Electronic and Electrical Engineering Embargoed Research Papers |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | File embargoed until 3/1/2022 | 6.85 MB | Adobe PDF | View/Open |
Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.