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Title: Applications of machine learning to machine fault diagnosis: A review and roadmap
Authors: Lei, Y
Yang, B
Jiang, X
Jia, F
Li, N
Nandi, AK
Keywords: Machines;Intelligent fault diagnosis;Machine learning;Deep learning;Transfer learning
Issue Date: 2020
Publisher: Elsevier
Citation: Mechanical Systems and Signal Processing, 2020, 138
ISSN: 0888-3270
Appears in Collections:Dept of Electronic and Electrical Engineering Embargoed Research Papers

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