Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/20040
Title: | Applications of machine learning to machine fault diagnosis: A review and roadmap |
Authors: | Lei, Y Yang, B Jiang, X Jia, F Li, N Nandi, AK |
Keywords: | Machines;Intelligent fault diagnosis;Machine learning;Deep learning;Transfer learning |
Issue Date: | 2020 |
Publisher: | Elsevier |
Citation: | Mechanical Systems and Signal Processing, 2020, 138 |
URI: | http://bura.brunel.ac.uk/handle/2438/20040 |
DOI: | http://dx.doi.org/10.1016/j.ymssp.2019.106587 |
ISSN: | 0888-3270 http://dx.doi.org/10.1016/j.ymssp.2019.106587 1096-1216 |
Appears in Collections: | Dept of Electronic and Electrical Engineering Embargoed Research Papers |
Files in This Item:
File | Description | Size | Format | |
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FullText.pdf | File embargoed until 3/1/2022 | 6.85 MB | Adobe PDF | View/Open |
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