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DC Field | Value | Language |
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dc.contributor.author | Lou, S | - |
dc.contributor.author | Tang, D | - |
dc.contributor.author | Zeng, W | - |
dc.contributor.author | Zhang, T | - |
dc.contributor.author | Gao, F | - |
dc.contributor.author | Muhamedsalih, H | - |
dc.contributor.author | Jiang, X | - |
dc.contributor.author | Scott, PJ | - |
dc.date.accessioned | 2023-06-05T12:47:07Z | - |
dc.date.available | 2023-06-05T12:47:07Z | - |
dc.date.issued | 2020-02-26 | - |
dc.identifier | ORCID iDs: Shan Lou https://orcid.org/0000-0002-8426-5596; Dawei Tang https://orcid.org/0000-0002-8914-7038; Wenhan Zeng https://orcid.org/0000-0002-8615-1293; Tao Zhang https://orcid.org/0000-0001-6087-3960; Feng Gao https://orcid.org/0000-0003-3835-6929; Hussam Muhamedsalih https://orcid.org/0000-0001-9125-5516; Xiangqian Jiang https://orcid.org/0000-0001-7949-8507; Paul J. Scott https://orcid.org/0000-0002-6092-3101. | - |
dc.identifier.citation | Lou, S. et al. (2020) 'Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces', IEEE Transactions on Instrumentation and Measurement, 69 (9), pp. 6509 - 6517. doi: 10.1109/TIM.2020.2967571. | en_US |
dc.identifier.issn | 0018-9456 | - |
dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/26607 | - |
dc.description.abstract | © Copyright 2020 The Authors. In comparison to tactile sensors, optical techniques can provide a fast, nondestructive profile/areal surface measurement solution. Nonetheless, high measurement noise, unmeasured points, and outliers are often observed in optical measurement, particularly for structured surfaces. To alleviate their detrimental impacts on the characterization of surface topography as well as the examination of micro/nanoscale geometries, a post processing filtering technique, i.e., the clustering filter, which is essentially an iterative process to find the aggregation center of a cluster of points, is implemented. The clustering filter is particularly useful for noises and outlier suppression for optical measurement of structured surfaces due to its edge-preserving capability. Five surface samples with structured features are measured by an in-house developed dispersive interferometer and a commercial white light interferometer, thereafter the measured surface data are filtered by the clustering filter. Both noise and outliers are suppressed, which not only facilitates the visualization and characterization of surface topography, but also enables the accurate evaluation of local functional geometries. | en_US |
dc.description.sponsorship | 10.13039/501100000266-Engineering and Physical Sciences Research Council (EPSRC), U.K., funding of the Future Advanced Metrology Hub (Grant Number: EP/P006930/1); 10.13039/501100000266-EPSRC (Grant Number: EP/S000453/1); 10.13039/501100000287-Royal Academy of Engineering (Grant Number: RCSRF1516/2/7). | en_US |
dc.format.extent | 6509 - 6517 | - |
dc.format.medium | Print-Electronic | - |
dc.language | English | - |
dc.language.iso | en_US | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.rights | © Copyright 2020 The Authors. Published by Institute of Electrical and Electronics Engineers (IEEE). This work is licensed under a Creative Commons (CC BY) Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/ | - |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | - |
dc.subject | clustering filter | en_US |
dc.subject | de-noising algorithm | en_US |
dc.subject | optical metrology | en_US |
dc.subject | structured surface | en_US |
dc.subject | surface measurement | en_US |
dc.title | Application of Clustering Filter for Noise and Outlier Suppression in Optical Measurement of Structured Surfaces | en_US |
dc.type | Article | en_US |
dc.identifier.doi | https://doi.org/10.1109/TIM.2020.2967571 | - |
dc.relation.isPartOf | IEEE Transactions on Instrumentation and Measurement | - |
pubs.issue | 9 | - |
pubs.publication-status | Published | - |
pubs.volume | 69 | - |
dc.identifier.eissn | 1557-9662 | - |
dc.rights.holder | The Authors | - |
Appears in Collections: | Dept of Mechanical and Aerospace Engineering Research Papers |
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FullText.pdf | © Copyright 2020 The Authors. Published by Institute of Electrical and Electronics Engineers (IEEE). This work is licensed under a Creative Commons (CC BY) Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/ | 2.28 MB | Adobe PDF | View/Open |
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