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Title: Random telegraph signals in charge coupled devices
Authors: Smith, DR
Holland, AD
Hutchinson, IB
Keywords: Random telegraph signal;CCD;Charge coupled device;Radiation damage
Issue Date: 2004
Publisher: Elsevier
Citation: Nuclear Instruments and Methods, A530: 521-535
Abstract: An investigation of fluctuating pixels resulting from proton irradiation of an E2V Technologies CCD47-20 device is presented. The device structure,experimental set up and irradiation methodology are described, followed by a detailed analysis of radiation induced random telegraph signals,RTS. The characteristics of the observed flickering pixels are discussed in detail and the proposed models explaining the mechanism behind the phenomena are viewed in light of the collected data.
Appears in Collections:Electronic and Computer Engineering
Dept of Electronic and Computer Engineering Research Papers

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