Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/29251
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dc.contributor.authorSanderson, D-
dc.contributor.authorMalin, B-
dc.contributor.authorKalganova, T-
dc.contributor.authorOtt, R-
dc.coverage.spatialHuntsville, AL, USA-
dc.date.accessioned2024-06-23T09:46:30Z-
dc.date.available2024-06-23T09:46:30Z-
dc.date.issued2022-10-25-
dc.identifierORCiD: Tatiana Kalganova https://orcid.org/0000-0003-4859-7152-
dc.identifier.citationSanderson, D. et al. (2022) 'Dimensionality Reduction to Dynamically Reduce Data', 2022 IEEE Physical Assurance and Inspection of Electronics, PAINE 2022, Huntsville, AL, USA, 25-27 October, pp. 1 - 5. doi: 10.1109/PAINE56030.2022.10014786.en_US
dc.identifier.isbn979-8-3503-9909-7 (ebk)-
dc.identifier.issn979-8-3503-9910-3 (PoD)-
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/29251-
dc.description.abstractWe perform experiments using dynamic data reduction on datasets of moderate complexity, with focus on classification of a Micro-PCB image dataset. As deep learning models increase in complexity, the data that they use increases at a rate we can't keep up with. The result of this is often slight improvements to the model's accuracy, at the improportional cost of computational runtime, which increases the electricity used, and ultimately carbon emissions. By using data reduction techniques, we attempt to identify the least critical data to be excluded from training, which in turn cuts the environmental cost. We show the effect of data reduction techniques on moderately complex image data, including PCB images, to reduce runtime by 2% and improve the accuracy by 0.013%.en_US
dc.format.extent1 - 5-
dc.format.mediumPrint-Electronic-
dc.languageEnglish-
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsCopyright © 2022 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works by sending a request to pubs-permissions@ieee.org. For more information, see https://journals.ieeeauthorcenter.ieee.org/becomean-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.rights.urihttps://journals.ieeeauthorcenter.ieee.org/becomean-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.source2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)-
dc.source2022 IEEE Physical Assurance and Inspection of Electronics (PAINE)-
dc.subjectdata reductionen_US
dc.subjectdynamic data reductionen_US
dc.subjectUMAPen_US
dc.titleDimensionality Reduction to Dynamically Reduce Dataen_US
dc.typeConference Paperen_US
dc.date.dateAccepted2022-08-08-
dc.identifier.doihttps://doi.org/10.1109/PAINE56030.2022.10014786-
dc.relation.isPartOf2022 IEEE Physical Assurance and Inspection of Electronics, PAINE 2022-
pubs.finish-date2022-10-27-
pubs.finish-date2022-10-27-
pubs.publication-statusPublished-
pubs.start-date2022-10-25-
pubs.start-date2022-10-25-
dc.rights.holderInstitute of Electrical and Electronics Engineers (IEEE)-
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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