Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/30820
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dc.contributor.authorTaheri, S-
dc.contributor.authorIhalage, A-
dc.contributor.authorMishra, P-
dc.contributor.authorCoaker, S-
dc.contributor.authorMuhammad, F-
dc.contributor.authorAl-Raweshidy, H-
dc.date.accessioned2025-02-25T19:58:18Z-
dc.date.available2025-02-25T19:58:18Z-
dc.date.issued2025-02-17-
dc.identifierORCiD: Achintha Ihalage https://orcid.org/0000-0002-4250-187X-
dc.identifierORCiD: Hamed Al-Raweshidy https://orcid.org/0000-0002-3702-8192-
dc.identifier.citationTaheri, S. et al. (2025) 'Domain Tailored Large Language Models for Log Mask Prediction in Cellular Network Diagnostics', IEEE Transactions on Network and Service Management, 0 (early access), pp. 1 - 13. doi: 10.1109/tnsm.2025.3541384.en_US
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/30820-
dc.description.abstractSoftware logs generated by dedicated network testing hardware are often complex and bear minimal similarity to natural language, requiring the expertise of engineers to understand and capture defects recorded in these logs. This manual process is inefficient and expensive for both service providers and their clients. In this study, we demonstrate the transformative potential of Artificial Intelligence (AI), specifically through domain-tailoring of Large Language Models (LLMs) like RoBERTa, BigBird, and Flan-T5, to streamline the process of defect diagnostics. Particularly, we pre-train these models ground up on a real industrial telecommunications log corpus, and perform finetuning on a multi-label classification objective. This facilitates identifying a correct set of log points to be enabled for rapid detection of defects that arise during network testing. Despite encountering several challenges such as intricate text structures, heavily skewed label distribution, and inconsistencies in historical data labelling, our tailored LLMs achieve commendable performance on previously unseen defect cases, significantly reducing the turnaround times. This research not only serves as an exemplar for adapting LLMs in telecommunications industry for automated defect diagnostics, but also has wide implications for software log analysis across various industries.en_US
dc.format.extent1 - 13-
dc.format.mediumElectronic-
dc.languageEnglis-
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsCopyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works (https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/).-
dc.rights.urihttps://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.subjecttelecommunicationsen_US
dc.subjectmachine learningen_US
dc.subjectLLMen_US
dc.subjectlog analysisen_US
dc.subjectnetwork diagnosticsen_US
dc.titleDomain Tailored Large Language Models for Log Mask Prediction in Cellular Network Diagnosticsen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.1109/tnsm.2025.3541384-
dc.relation.isPartOfIEEE Transactions on Network and Service Management-
pubs.issueearly access-
pubs.publication-statusPublished-
pubs.volume0-
dc.identifier.eissn1932-4537-
dc.rights.holderInstitute of Electrical and Electronics Engineers (IEEE)-
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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