Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/31415
Title: SDNet: Noise-Robust Bandwidth Extension under Flexible Sampling Rates
Authors: Yang, J
Liu, H
Gan, L
Zhou, Y
Li, X
Jia, J
Yao, J
Keywords: time-frequency analysis;convolution;superresolution;noise;neural networks;bandwidth;maintenance engineering;noise robustness;signal resolution;spectrogram
Issue Date: 3-Dec-2024
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
Citation: Yang, J. et al. (2024) 'SDNet: Noise-Robust Bandwidth Extension under Flexible Sampling Rates', APSIPA ASC 2024 - Asia Pacific Signal and Information Processing Association Annual Summit and Conference 2024, Macao, 3-6 December, pp. 1 - 5. doi: 10.1109/APSIPAASC63619.2025.10848923.
Abstract: Bandwidth extension (BWE), also known as audio super-resolution (SR), aims to predict a high resolution (HR) speech signal from its low resolution (LR) corresponding part. Most neural BWE models work at a specific sampling rate but, producing the final result in a noise-free environment by recovering the spectrogram of high-frequency part of the signal and concatenating it with the original low-frequency part. Although these methods achieve high accuracy, they become less effective when facing the real-world scenario, where unavoidable noise is present and sampling rates are flexible. To address this problem, we propose Super Denoise Net (SDNet), a neural network for a joint task of BWE and noise reduction from a flexible low sampling rate signal. To that end, we design gated convolution and lattice convolution blocks to enhance the repair capability and capture information in the time-frequency axis, respectively. The experiments show our method outperforms all current state-of-the-art (SOTA) noise-robust BWE model in Valentini-Botinhao test set. Our model also outperforms other baselines on DNS 2020 no-reverb test set with higher objective and subjective scores.
URI: https://bura.brunel.ac.uk/handle/2438/31415
DOI: https://doi.org/10.1109/APSIPAASC63619.2025.10848923
ISBN: 979-8-3503-6733-1 (ebk)
979-8-3503-6734-8 (PoD)
ISSN: 2640-009X
Other Identifiers: ORCiD: Lu Gan https://orcid.org/0000-0003-1056-7660
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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