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DC Field | Value | Language |
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dc.contributor.author | Wang, L | - |
dc.contributor.author | Wang, Z | - |
dc.contributor.author | Xu, C | - |
dc.contributor.author | Lu, G | - |
dc.contributor.author | Hua, L | - |
dc.date.accessioned | 2025-09-18T08:40:06Z | - |
dc.date.available | 2025-09-18T08:40:06Z | - |
dc.date.issued | 2025-07-10 | - |
dc.identifier | ORCiD: Li Wang https://orcid.org/0000-0002-0980-350X | - |
dc.identifier | ORCiD: Zidong Wang https://orcid.org/0000-0002-9576-7401 | - |
dc.identifier | ORCiD: Chao Xu https://orcid.org/0009-0007-7494-8426 | - |
dc.identifier | ORCiD: Guoping Lu https://orcid.org/0000-0002-6815-4554 | - |
dc.identifier | ORCiD: Liang Hua https://orcid.org/0000-0002-7739-3733 | - |
dc.identifier.citation | Wang, L. et al. (2025) 'A Novel Fault Diagnosis Method for Multistage Conversion Circuits Based on Data Fusion', IEEE Transactions on Industrial Electronics, 0 (early access), pp. 1 - 12. doi: 10.1109/TIE.2025.3579084. | en_US |
dc.identifier.issn | 0278-0046 | - |
dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/32015 | - |
dc.description.abstract | This article addresses the research gap on fault diagnosis of multistage conversion circuits within analog circuit fault diagnosis. A diagnostic system is introduced, in which multipoint data fusion is combined with deep feature analysis, leading to the integrated dual-axis vision transformer system. Initially, signals from multiple monitoring points are fused through the integrated wavelet transform algorithm. Following this, deeper secondary data fusion is achieved by the dual-axis vision transformer algorithm, which utilizes a dual-axis observation encoder and an axial data decoder to interact between time-domain and frequency-domain features. This approach effectively analyzes signal characteristics, improving the accuracy of fault diagnosis. In experiments with the LLC series resonant converter, both soft and hard faults were reliably diagnosed by the system, showing excellent accuracy, recall, and F1 score metrics. | en_US |
dc.description.sponsorship | This work was supported in part by the National Natural Science Foundation of China under Grant 62103205, Grant 62473215, and Grant 62473216 and in part by the Natural Science Foundation of the Jiangsu Higher Education Institutions of China under Grant 23KJA120002. | en_US |
dc.format.extent | 1 - 12 | - |
dc.format.medium | Print-Electronic | - |
dc.language | English | - |
dc.language.iso | en_US | en_US |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
dc.rights | Copyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ). | - |
dc.rights.uri | https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ | - |
dc.subject | dual-axis vision transformer | en_US |
dc.subject | data fusion | en_US |
dc.subject | fault diagnosis | en_US |
dc.subject | integrated wavelet transform (IWT) | en_US |
dc.subject | multistage conversion circuit | en_US |
dc.title | A Novel Fault Diagnosis Method for Multistage Conversion Circuits Based on Data Fusion | en_US |
dc.type | Article | en_US |
dc.date.dateAccepted | 2025-05-30 | - |
dc.identifier.doi | https://doi.org/10.1109/TIE.2025.3579084 | - |
dc.relation.isPartOf | IEEE Transactions on Industrial Electronics | - |
pubs.issue | 0 | - |
pubs.publication-status | Published | - |
pubs.volume | 00 | - |
dc.identifier.eissn | 1557-9948 | - |
dcterms.dateAccepted | 2025-05-30 | - |
dc.rights.holder | Institute of Electrical and Electronics Engineers (IEEE) | - |
Appears in Collections: | Dept of Computer Science Research Papers |
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FullText.pdf | Copyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ). | 2.78 MB | Adobe PDF | View/Open |
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