Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/32317
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dc.contributor.authorCao, J-
dc.contributor.authorMiao, J-
dc.contributor.authorTao, H-
dc.contributor.authorWang, Y-
dc.contributor.authorWu, J-
dc.contributor.authorWang, Z-
dc.contributor.authorWu, X-
dc.date.accessioned2025-11-07T17:35:29Z-
dc.date.available2025-11-07T17:35:29Z-
dc.date.issued2025-09-29-
dc.identifierORCiD: Zidong Wang https://orcid.org/0000-0002-9576-7401-
dc.identifier.citationCao, J. et al. (2025) 'Generative Models for Time Series Anomaly Detection: A Survey', IEEE Transactions on Artificial Intelligence, 0 (early access), pp. 1 - 21. doi: 10.1109/TAI.2025.3614213.en_US
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/32317-
dc.descriptionImpact Statement: Generative approaches have shown exceptional performance in TSAD. Various emerging generative methods have expanded in this field, signaling a shift from traditional to deep generative techniques. Although some studies have reviewed the use of generative models like GANs and Transformers in time series, a comprehensive synthesis of these methods for anomaly detection is still lacking. This paper reviews existing work on mainstream generative approaches for this purpose. We summarize datasets and analyze methods suited to different dataset characteristics, providing tailored recommendations for various application domains. The goal of this paper is to offer researchers a reliable review and valuable guidance for future work.en_US
dc.description.abstractTime series anomaly detection (TSAD) is a fundamental practice in information management, aimed at identifying unusual patterns in temporal datasets. This process is critical to maintaining the integrity and reliability of systems. Recently, generative models have significantly advanced the capabilities of artificial general intelligence, presenting novel methodologies to understand and interpret complex data structures. In this review, we examine the latest advancements in applying generative models to TSAD and highlight how these models present a paradigm shift in detecting and analyzing anomalies within sequential data. In particular, we first present the background information, including definitions of key concepts, a taxonomy of anomaly types, and the distinction between generative and discriminative models in time series data. Then, we investigate a range of generative models, offering mathematical summaries of the predominant techniques in TSAD. Furthermore, we provide a summary of the datasets and propose recommendations for appropriate generative methods tailored to various application domains. Finally, we address the significant challenges in current research and propose potential directions for future study.en_US
dc.description.sponsorshiphis research received no specific grant from any funding agency in the public, commercial, or not-for-profit sectors.en_US
dc.format.extent1 - 21-
dc.format.mediumElectronic-
dc.languageEnglish-
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsCopyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ).-
dc.rights.urihttps://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/-
dc.subjectdeep learningen_US
dc.subjectgenerative modelsen_US
dc.subjecttime series anomaly detectionen_US
dc.subjectsurveyen_US
dc.titleGenerative Models for Time Series Anomaly Detection: A Surveyen_US
dc.typeArticleen_US
dc.identifier.doihttps://doi.org/10.1109/TAI.2025.3614213-
dc.relation.isPartOfIEEE Transactions on Artificial Intelligence-
pubs.issue0-
pubs.publication-statusPublished-
pubs.volume00-
dc.identifier.eissn2691-4581-
dc.rights.holderInstitute of Electrical and Electronics Engineers (IEEE)-
Appears in Collections:Dept of Computer Science Research Papers

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