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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Fang, J | - |
| dc.contributor.author | Wang, Z | - |
| dc.contributor.author | Liu, W | - |
| dc.contributor.author | Zeng, N | - |
| dc.contributor.author | He, Y | - |
| dc.contributor.author | Cao, Y | - |
| dc.contributor.author | Chen, L | - |
| dc.contributor.author | Liu, X | - |
| dc.date.accessioned | 2025-12-04T17:09:43Z | - |
| dc.date.available | 2025-12-04T17:09:43Z | - |
| dc.date.issued | 2025-10-22 | - |
| dc.identifier | ORCiD: Jingzhong Fang https://orcid.org/0000-0002-3037-3479 | - |
| dc.identifier | ORCiD: Zidong Wang https://orcid.org/0000-0002-9576-7401 | - |
| dc.identifier | ORCiD: Weibo Liu https://orcid.org/0000-0002-8169-3261 | - |
| dc.identifier | ORCiD: Nianyin Zeng https://orcid.org/0000-0002-6957-2942 | - |
| dc.identifier | ORCiD: Linwei Chen https://orcid.org/0009-0008-2328-038X | - |
| dc.identifier | ORCiD: Xiaohui Liu https://orcid.org/0000-0003-1589-1267 | - |
| dc.identifier.citation | Fang, J. et al. (2025) 'Learning With Noisy Labels for Industrial Time Series Outlier Detection: A Transformer-Embedded Contrastive Learning Framework', IEEE Transactions on Industrial Informatics, 0 (early access), pp. 1 - 11. doi: 10.1109/TII.2025.3616850. | en_US |
| dc.identifier.issn | 1551-3203 | - |
| dc.identifier.uri | https://bura.brunel.ac.uk/handle/2438/32452 | - |
| dc.description.abstract | In many real-world industrial scenarios, acquiring accurately labeled data are often challenging due to limited resources or unexpected errors. Learning with noisy labels (LNL) has emerged as a significant research topic, aiming to develop reliable deep learning models using noisy-labeled training data. In this article, a novel Transformer-embedded LNL framework with fuzzy-clustering-assisted contrastive learning is developed for industrial time series outlier detection under noisy labels. Specifically, a fuzzy-clustering-assisted contrastive learning strategy is proposed to enhance the robustness of the Transformer encoder against noisy labels by leveraging the intrinsic characteristics of raw data. Furthermore, a dynamic two-stage training scheme is introduced to train the outlier detector. In the first training stage, the Transformer encoder is pretrained through data reconstruction to improve feature extraction capabilities for industrial time series. In the second stage, the outlier detector is jointly trained with the Transformer encoder, incorporating a joint learning strategy. Furthermore, a label-consistency regularization term is designed to enhance the robustness of the outlier detector against noisy labels by minimizing the discrepancy between the outputs of the outlier detector and the clustering algorithm. The proposed framework is applied to industrial time series data collected from a real-world wire arc additive manufacturing (WAAM) process. Experimental results demonstrate that the developed framework outperforms selected representative LNL approaches in WAAM outlier detection under both low and high noise ratios. | en_US |
| dc.description.sponsorship | Independent Innovation Foundation of AECC (Grant Number: ZZCX-2023-005); Natural Science Foundation for Distinguished Young Scholars of the Fujian Province of China (Grant Number: 2023J06010); National Key Research and Development Program of China (Grant Number: 2024YFC3407000); Royal Society of the U.K.; Alexander von Humboldt Foundation of Germany. | en_US |
| dc.format.extent | 1 - 11 | - |
| dc.language | English | - |
| dc.language.iso | en_US | en_US |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_US |
| dc.rights | Copyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ). | - |
| dc.rights.uri | https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ | - |
| dc.subject | industrial time series analysis | en_US |
| dc.subject | learning with noisy labels (LNL) | en_US |
| dc.subject | outlier detection | en_US |
| dc.subject | weakly supervised learning | en_US |
| dc.title | Learning With Noisy Labels for Industrial Time Series Outlier Detection: A Transformer-Embedded Contrastive Learning Framework | en_US |
| dc.type | Article | en_US |
| dc.date.dateAccepted | 2025-09-22 | - |
| dc.identifier.doi | https://doi.org/10.1109/TII.2025.3616850 | - |
| dc.relation.isPartOf | IEEE Transactions on Industrial Informatics | - |
| pubs.issue | 0 | - |
| pubs.publication-status | Published | - |
| pubs.volume | 00 | - |
| dc.identifier.eissn | 1941-0050 | - |
| dcterms.dateAccepted | 2025-09-22 | - |
| dc.rights.holder | Institute of Electrical and Electronics Engineers (IEEE) | - |
| Appears in Collections: | Dept of Computer Science Research Papers | |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| FullText.pdf | Copyright © 2025 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works ( https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/ ). | 5.27 MB | Adobe PDF | View/Open |
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