Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/32463
Title: Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid
Authors: Famelton, JR
Hughes, GM
Williams, CA
Barbatti, C
Moody, MP
Bagot, PAJ
Keywords: Al-Mg-Si-Cu alloy;Xe plasma focussed ion beam;atom probe tomography;dispersoid
Issue Date: 19-May-2021
Publisher: Elsevier
Citation: Famelton, J.R. et al. (2021) 'Xenon plasma focussed ion beam preparation of an Al-6XXX alloy sample for atom probe tomography including analysis of an α-Al(Fe,Mn)Si dispersoid', Materials Characterization, 178, 111194, pp. 1 - 12. doi: 10.1016/j.matchar.2021.111194.
Abstract: A Xe plasma Focussed Ion Beam instrument was used to prepare in-situ specimens for Atom Probe Tomography from a bulk sample of an aluminium 6XXX alloy. The nature and distribution of precipitates and solute clusters observed in the alloy are not observed to differ between standard electropolishing methods and Xe plasma preparation. Enabled by site specific specimen preparation, analysis of an α-Al(Fe,Mn)Si dispersoid shows segregation at the phase boundary and in the shell of the dispersoid.
Description: Data availability: The raw/process data required to reproduce these findings cannot be shared at this time as the data also forms part of an ongoing study.
URI: https://bura.brunel.ac.uk/handle/2438/32463
DOI: https://doi.org/10.1016/j.matchar.2021.111194
ISSN: 1044-5803
Other Identifiers: ORCiD: James R. Famelton https://orcid.org/0000-0002-8824-2842
Article number: 111194
Appears in Collections:Brunel Centre for Advanced Solidification Technology (BCAST)

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