Please use this identifier to cite or link to this item: https://bura.brunel.ac.uk/handle/2438/33703
Full metadata record
DC FieldValueLanguage
dc.contributor.authorPapananias, Moschos-
dc.contributor.authorNoh, Yohan-
dc.contributor.authorCheng, Kai-
dc.date.accessioned2026-08-14T14:26:49Z-
dc.date.available2026-08-14T14:26:49Z-
dc.date.issued2026-06-26-
dc.identifier.citationPapananias, M., Noh, Y. and Cheng, K. (2026) 'Intelligent Monitoring of Machining Processes using Gaussian Process Regression and On-Machine Comparator Measurement', 2026 IEEE International Conference on Automatic Control and Intelligent Systems (I2CACIS), Kuala Lumpur, Malaysia, 26-27 June, pp. 81–86. doi: 10.1109/i2cacis69435.2026.11600326.en_US
dc.identifier.isbn9798331561703-
dc.identifier.isbn9798331561697-
dc.identifier.isbn9798331561710-
dc.identifier.issn2995-2840-
dc.identifier.otherhttps://doi.org/10.1109/i2cacis69435.2026.11600326-
dc.identifier.urihttps://bura.brunel.ac.uk/handle/2438/33703-
dc.description.abstractThis paper presents an intelligent machining process monitoring approach with emphasis on On-Machine Comparator Measurement (OMCM) and the effect of remastering on dimensional accuracy. Comparator measurement applies the comparator principle by referencing each measurement to a calibrated master part. In this approach, a mastering procedure is first performed by measuring the calibrated master part to establish a reference. By directly comparing the test part with the master part under repeatability conditions, constant systematic errors in the measurement system are effectively cancelled when determining deviations from the master part. However, the accuracy of this method depends on the time interval between mastering and subsequent production measurements. An experimental study is conducted on a vertical milling centre using non-intrusive sensing. Gaussian Process Regression (GPR) is employed to model Coordinate Measuring Machine (CMM) measured diameter deviations and the associated uncertainty. OMCM is implemented, and the effect of remastering is discussed. The results demonstrate that measurement accuracy deteriorates when remastering is not performed prior to significant system drift, whereas timely remastering improves accuracy and reduces uncertainty, highlighting the critical role of remastering in maintaining measurement reliability with OMCM.en_US
dc.description.sponsorship10.13039/501100000288-Royal Societyen_US
dc.format.extentpp. 81-86-
dc.format.mediumPrint-Electronic-
dc.language.isoenen_US
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.rightsLicence for published version: Publisher's own licence-
dc.rightsRe-use licence for this version: InCopyright-
dc.rights.urihttps://rightsstatements.org/page/InC/1.0/-
dc.source2026 IEEE International Conference on Automatic Control and Intelligent Systems (I2CACIS)-
dc.subjectGaussian process regressionen_US
dc.subjectintelligent manufacturingen_US
dc.subjectmachining processesen_US
dc.subjecton-machine comparator measurementen_US
dc.subjectprocess monitoring and controlen_US
dc.titleIntelligent Monitoring of Machining Processes using Gaussian Process Regression and On-Machine Comparator Measurementen_US
dc.typeConference paperen_US
dc.identifier.doihttps://doi.org/10.1109/i2cacis69435.2026.11600326-
dc.relation.isPartOf2026 IEEE International Conference on Automatic Control and Intelligent Systems (I2CACIS)-
pubs.finish-date2026-06-27-
pubs.publication-statusPublished-
pubs.start-date2026-06-26-
dc.identifier.eissn2995-2859-
dcterms.issued2026-06-26-
dc.date.updated2026-08-04T13:33:56Z-
dc.rights.holderInstitute of Electrical and Electronics Engineers (IEEE)-
dc.contributor.orcidPapananias, Moschos [0000-0001-7121-9681]-
dc.contributor.orcidNoh, Yohan [0000-0002-1103-6397]-
dc.contributor.orcidCheng, Kai [0000-0001-6872-9736]-
Appears in Collections:Department of Mechanical and Aerospace Engineering Research Papers

Files in This Item:
File Description SizeFormat 
FullText.pdfCopyright © 2026 Institute of Electrical and Electronics Engineers (IEEE). Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. See: https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/guidelines-and-policies/post-publication-policies/1.51 MBAdobe PDFView/Open


Items in BURA are protected by copyright, with all rights reserved, unless otherwise indicated.