Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/17771
Title: Detecting defects in PCB using deep learning via convolution neural networks
Authors: Adibhatla, VA
Shieh, JS
Abbod, MF
Chih, HC
Hsu, CC
Cheng, J
Keywords: Convolution;Deep learning;Training;Inspection
Issue Date: 2019
Publisher: IEEE
Citation: Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT, 2019, 2018-October pp. 202 - 205
URI: http://bura.brunel.ac.uk/handle/2438/17771
DOI: http://dx.doi.org/10.1109/IMPACT.2018.8625828
ISSN: 2150-5934
http://dx.doi.org/10.1109/IMPACT.2018.8625828
Appears in Collections:Dept of Electronic and Computer Engineering Embargoed Research Papers

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