Please use this identifier to cite or link to this item:
http://bura.brunel.ac.uk/handle/2438/17771
Title: | Detecting defects in PCB using deep learning via convolution neural networks |
Authors: | Adibhatla, VA Shieh, JS Abbod, MF Chih, HC Hsu, CC Cheng, J |
Keywords: | Convolution;Deep learning;Training;Inspection |
Issue Date: | 2019 |
Publisher: | IEEE |
Citation: | Proceedings of Technical Papers - International Microsystems, Packaging, Assembly, and Circuits Technology Conference, IMPACT, 2019, 2018-October pp. 202 - 205 |
URI: | http://bura.brunel.ac.uk/handle/2438/17771 |
DOI: | http://dx.doi.org/10.1109/IMPACT.2018.8625828 |
ISSN: | 2150-5934 http://dx.doi.org/10.1109/IMPACT.2018.8625828 |
Appears in Collections: | Dept of Electronic and Electrical Engineering Embargoed Research Papers |
Files in This Item:
File | Description | Size | Format | |
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FullText.pdf | Embargoed until 1/1/2030 | 650.32 kB | Adobe PDF | View/Open |
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