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Title: Development of generic testing strategies for mixed-signal integrated circuits
Authors: Pritchard, TI
Evans, PSA
Taylor, D
Keywords: Generic tesring; Mixed-signal ICs; Integrated crrcuits
Issue Date: 1992
Publisher: IEEE
Citation: IEE Proc. Part G, Volume 139, No.2, April 1992. Pages 231 - 233.
Abstract: Describes work at the Polytechnic of Huddersfield SERC/DTI research project IED 2/1/2121 conducted in collaboration with GEC-Plessey Semiconductors, Wolfson Microelectronics, and UMIST. The aim of the work is to develop generic testing strategies for mixed-signal (mixed analogue and digital) integrated circuits. The paper proposes a test structure for mixed-signal ICs, and details the development of a test technique and fault model for the analogue circuit cells encountered in these devices. Results obtained during the evaluation of this technique in simulation are presented, and the ECAD facilities that have contributed to this and other such projects are described.
ISSN: 0956-3768
Appears in Collections:Design
Dept of Design Research Papers

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