Please use this identifier to cite or link to this item: http://bura.brunel.ac.uk/handle/2438/30870
Title: Bonding Defect Detection Based on Improved Single Shot MultiBox Detector
Authors: Gao, H
Jin, Y
Li, M
Chen, Y
Zang, J
Fan, X
Keywords: SSD;defect detection;DenseNet;dilated convolution;CBAM;focal loss
Issue Date: 31-Dec-2024
Publisher: Bratislava Institute of Informatics, Slovak Academy of Sciences
Citation: Gao, H. et al. (2024) 'Bonding Defect Detection Based on Improved Single Shot MultiBox Detector', Computing and Informatics, 43 (6), pp. 1432 - 1454. doi: 10.31577/cai_2024_6_1432.
Abstract: To solve the problem of time-consuming and low efficiency in manual defect detection, this paper proposes a bonding defect detection algorithm based on improved Single Shot MultiBox Detector (SSD). DenseNet is used to replace VGG of the SSD algorithm to improve the detection effect of bonding defect. A novel feature fusion network is designed, in which dilated convolution is used to reduce the size of the low-level feature map, and it is fused with the high-level feature map, and then the Convolutional Block Attention Module (CBAM) attention mechanism is used to increase the ability to extract the features. Focal loss is used to control the ratio of positive and negative samples for training and suppress easily separable samples, so that the samples involved in training have better distribution and the model has better detection performance. Then, the defect data set is constructed and a comparison experiment is carried out. The results show that the mAP, Precision, and Recall of the improved SSD network are increased to 75.9 %, 77.3 %, and 75.6 %, respectively, which can better identify bonding defect.
URI: https://bura.brunel.ac.uk/handle/2438/30870
DOI: https://doi.org/10.31577/cai_2024_6_1432
ISSN: 1335-9150
Other Identifiers: ORCiD: Maozhen Li https://orcid.org/0000-0002-0820-5487
Appears in Collections:Dept of Electronic and Electrical Engineering Research Papers

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